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1. ¹ÝµµÃ¼ Å×½ºÆ® Àåºñ °³¹ß, »ý»ê, ÆǸÅ
- Memory Test Systems ¹× Device Interface
- SOC Test Systems
- SOC Test Handler
2. ¹ÝµµÃ¼ Ư¼ººÐ¼® ¹× ºÒ·® ºÐ¼® Àåºñ
- Focused lon Beam Circuit Edit
- Emission Microscopy EFA Àåºñ
- Time-based Emission Scope
3. ¹ÝµµÃ¼ Surface Particle Counter
- Qlll+